Conference:
CIA-CT on industrial applications of Computed Tomography

11th Conference

19 May 2026

Technical University of Denmark
Meeting Center, building 101, room S09
Anker Engelundsvej 1
2800 Lyngby
Register here


Registration deadline 5 May 2026

About the conference

This year’s conference introduces the most recent advancements in Computed Tomography along with producing insight into diversified applications of CT scanning, ranging from industrial components including medical implants, to building materials, cultural heritage objects, and food products.
Some examples of AI-enhanced CT applications will be presented.

Organizers
The conference is organized by Leonardo De Chiffre, Professor emeritus, DTU Construct, Technical University of Denmark.

Program

08:30 - 09:00
Registration and light breakfast
09:00 - 09:10
Welcome and introduction by Venkata Nadimpalli, DTU Construct
09:10 - 09:50
CT analysis of additively manufactured orthopaedic implant structures

Paul Bills, Doctor, University of Huddersfield, Great Britain

With the growing clinical shift toward uncemented orthopaedic implants, ensuring reliable lattice structures is critical for achieving stable biological fixation.
Our work applies high‑resolution dimensional CT to verify the geometric fidelity and porosity of additively manufactured Ti6AL4V and PEEK lattices, parameters essential for osseointegration. CT‑derived metrics are then correlated with bone in‑growth potential, providing insight into design features that enhance fixation. In parallel, the same structural characteristics are evaluated for their influence on bacterial attachment, helping to map infection risk.
Together, these findings highlight the value of CT‑based assessment in balancing osseointegration performance with reduced infection‑related implant failure.

Paul Bills is a Reader in the Centre for Precision Technologies at the University of Huddersfield whose work centres on precision dimensional metrology and the CT characterisation of orthopaedic implant technologies. His research bridges engineering and medicine, advancing understanding of implant performance, osseointegration, and clinical reliability. He works closely with industrial and clinical partners to translate measurement science into improved patient care. He serves as Co Lead (Testing) for the EPSRC 4D Health Tech Network+ and is President of the Dimensional X Ray Computed Tomography Society.
09:50 - 10:20
XCT performance : image quality and dimensional measurement accuracy in standardization

Anne-Françoise Obaton, Researcher in metrology for additive manufacturing, LNE, France

As additive manufacturing (AM) moves toward industrial series production of parts in critical sectors, compliance with geometric and dimensional specifications, within defined tolerances, must be demonstrated. AM enables highly complex geometries with internal structures, making X-ray Computed Tomography (XCT) an essential metrological tool. Although XCT lacks traceability, the growing need for metrology in AM series production implies standardized methodologies, including simplified approaches to measurement uncertainty.
This talk addresses XCT performance in terms of image quality and dimensional measurement accuracy within standardization to achieve this goal.

Dr. habil. Anne-Françoise Obaton has been conducting research in metrology for additive manufacturing (AM) at the French National Metrology Institute (NMI): Laboratoire National de Métrologie et d'Essais (LNE) in Paris since 2014. Her work focuses on the investigation and qualification of volumetric non-destructive testing methods for AM quality assurance, with particular emphasis on X-ray computed tomography (XCT) and resonant ultrasound spectroscopy (RUS).
10:20 - 10:50
Coffee and networking break
10:50 - 11:20
Capabilities of AI for automated defect recognition in the X-Ray industry

Stephan Tschechne, Dr. Product Manager X-Ray, Carl Zeiss Industrielle Messtechnik GmbH, Germany

X-Ray technology plays a significant role in Non-Destructive Testing (NDT) of industrial parts across various sectors.
As the demand for speed, efficiency, and defect detection increases alongside growing part complexity, Artificial Intelligence (AI) solutions are becoming increasingly important.
This work examines the capabilities of AI in defect detection. It explores  AI solutions utilizing deep learning through case studies from diverse industry segments, highlighting their effectiveness and potential for enhancing NDT processes.

Dr. Stephan Tschechne has a background in computer science and neural information processing and is product manager at ZEISS Industrial Quality Solutions in Oberkochen, Germany.
11:20 - 11:50
Inspection of drillcores with microCT

Sina Maria Baier Stegmaier, Research Engineer, DTU Physics

X‑ray microCT is a powerful, non‑destructive technique for examining drill cores, as it reveals their internal structure in 3D without cutting or altering the samples. It enables geoscientists to identify fractures, lithological boundaries, porosity features, and inclusions with high spatial resolution. The resulting datasets also support quantitative analysis—such as density variations or volume fractions—thereby improving geological interpretation. This work explores the application of X‑ray microCT for efficient core logging and highlights key requirements for advancing future applications.

Dr. Sina Baier-Stegmaier is a research engineer at DTU Physics and works mainly with industrial application of X-ray CT at the 3D Imaging Center at DTU. She has a background in chemistry and performed her PhD at the Karlsruhe Institute of Technology working with X-ray microscopy and electron microscopy to study heterogeneous catalysts.
11:50 - 12:50
Lunch and networking break
12:50 - 13:20
Industrial applications: From Full Reconstructions to Sparse-Projection Strategies

Glenn Gunner Brink Nielsen, Project Manager, Danish Technological Institute

Computed Tomography is increasingly deployed in quality control spanning food processing, agriculture, and wood products. While full CT acquisition remains the gold standard for detailed volumetric analysis, many inline inspection scenarios demand higher throughput than conventional scanning permits. When products come from a known domain with well-characterized material properties, sparse-projection strategies offer a practical path toward fast, scalable inspection.
This talk surveys real-world CT applications across diverse product types, illustrating how domain knowledge can guide the transition from full to sparse acquisition. We also touch on deep learning–based image analysis using the MONAI framework.

Glenn Nielsen is an R&D project manager at the Danish Technological Institute, developing AI-driven inspection systems for food, agriculture and industrial applications, including sparse x-ray sensing for inline measurement. He holds a PhD in applied physics on nondestructive quality control.
13:20 - 13:50
Sparse-view and dual-energy CT for meat inspection – and other applications

Rasmus Juul Pedersen, PhD Student, DTU Compute

Dual‑energy X‑ray imaging can address key limitations of sparse‑view CT by providing accurate estimates of known material types along each ray path. Even with few projections, dual‑energy measurements enable separation of materials—such as lean, fat, and bone in meat inspection—and yield reliable per‑ray material distributions. When these distributions are combined across multiple angles and integrated with constraints from complementary vision‑based measurements, it becomes possible to derive parameters such as layer thickness and other internal structure. This can be used for fast, robust inspection of multi‑material objects where full CT acquisition is impractical, including but not limited to industrial meat processing where time is limited.

2025- PhD Student at DTU Compute Section for Visual Computing.
2024-2025 Research Assistant at DTU Compute Section for Visual Computing, working on Neural representation for CT reconstruction.
2022-2024 MSc Human-Centered Artificial Intelligence from DTU.
13:50 - 14:20
Coffee and networking break
14:20 - 14:50
Hierarchical Multiscale X-ray Phase-Contrast Tomography: Achieving centimeter-scale context to nanoscale detail in a single optical setup

Nis Christian Gellert, Postdoc, DTU Physics

This presentation introduces a hierarchical multiscale X-ray phase-contrast tomography setup developed at DTU and implemented at the DanMAX beamline at MAX IV. The instrument enables imaging of centimeter-scale samples while resolving sub-micron and nanoscale structural details within the same optical configuration. Operating across the full DanMAX energy range (15–35 keV), the system combines a large field-of-view detector with multilayer Laue lenses to bridge the traditional trade-off between resolution and sample size. The approach enables acquisition of multiscale structural information from intact samples, providing both global context and fine internal features. The concept is compatible with higher-energy hard X-rays, making it suitable for dense materials such as minerals, rocks, and structural materials, while maintaining phase-contrast sensitivity for weakly absorbing biological specimens.

Nis Christian Gellert is a postdoctoral researcher at DTU Physics working on X-ray phase-contrast tomography and instrumentation development. He holds a PhD from DTU Space and has a background in nanofabrication, X-ray optics, and ray-tracing simulations. His current work focuses on the implementation and development of the XTREME-CT multiscale tomography setup at the DanMAX beamline at MAX IV.
14:50 - 15:20
High throughput CT scanning for natural heritage

Carsten Gundlach, Senior Research Engineer, DTU Physics

To be announced.

Carsten Gundlach, Senior Executive Research Officer at DTU Physics and vice director of the Danish research infrastructure DANFIX and the 3D Imaging Center at DTU.
15:20 - 15:30
Closing remarks

Registration fee

 DKK 2,995  Members of Teknologisk Videndeling and promoting partners listed in the registration form
 DKK 3,595  Non-members
 DKK 1,125  PhD Students
 DKK 200  BSc and MSc students (To register as student you need to have a membership, which is free of charge for students – register here.)

All prices are excluded of Danish VAT 25%.

The fee includes talks, breakfast, lunch, coffee breaks, refreshments after the seminar and access to speakers’ presentations.

Early bird discount of DKK 300 by registering before 17 April 2026. Early-bird discount does not apply to BSc, MSc and PhD students.

Invoice will be forwarded 14 days before the event. It is possible to pay by credit card.

Cancellation of event

Should we have to cancel the event you will be notified approximately 14 days before the scheduled activity.

Registration

Binding registration
Registration is binding, however substitutions are accepted at any time. Please just contact us at teknologiskvidendeling@construct.dtu.dk.

Questions
Please do not hesitate to contact Teknologisk Videndeling by e-mailing teknologiskvidendeling@construct.dtu.dk

Promoting partners